A Review of Data-Driven Methods for Fault Localization and Diagnosis in  DFT-Enabled Circuit

Vivek Sharma

doi:10.22377/ajcse.v10i4.286

A Review of Data-Driven Methods for Fault Localization and Diagnosis in DFT-Enabled Circuit

Authors

Vivek Sharma System Analyst MITS Deemed University

DOI:

https://doi.org/10.22377/ajcse.v10i4.286

Abstract

Design-for-Test

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Published

2025-12-08

Issue

Vol. 10 No. 4 (2025): Asian Journal of Computer Science Engineering(AJCSE)

Section

Review Article

License

This work is licensed under a Creative Commons Attribution-NonCommercial 4.0 International License.

This is an Open Access article distributed under the terms of the Attribution-Noncommercial 4.0 International License [CC BY-NC 4.0], which requires that reusers give credit to the creator. It allows reusers to distribute, remix, adapt, and build upon the material in any medium or format, for noncommercial purposes only.

How to Cite

[1]

“A Review of Data-Driven Methods for Fault Localization and Diagnosis in DFT-Enabled Circuit”, ajcse, vol. 10, no. 4, Dec. 2025, doi: 10.22377/ajcse.v10i4.286.