VIVEK SHARMA. A Review of Data-Driven Methods for Fault Localization and Diagnosis in DFT-Enabled Circuit. Asian Journal of Computer Science Engineering(AJCSE), [S. l.], v. 10, n. 4, 2025. DOI: 10.22377/ajcse.v10i4.286. Disponível em: https://ajcse.info/index.php/ajcse/article/view/286. Acesso em: 11 feb. 2026.