PANKRATOV, E. L. On Decreasing of Quantity of Radiation Defects in Working Area of an Integrated Circuit. Asian Journal of Computer Science Engineering(AJCSE), [S. l.], v. 7, n. 03, 2022. DOI: 10.22377/ajcse.v7i03.187. Disponível em: https://ajcse.info/index.php/ajcse/article/view/187. Acesso em: 11 feb. 2026.