On Optimization of Manufacturing of Field-effect Transistors to Increase Their Integration Rate in the Framework of a Double-tail Dynamic Comparator
Main Article Content
Abstract
In this paper, we introduce an approach to increase integration rate of elements of a double-tail dynamic comparator. Framework the approach we consider a heterostructure with special configuration. Several specific areas of the heterostructure should be doped by diffusion or ion implantation. Annealing of dopant and/or radiation defects should be optimized.
Article Details
Section
Review Article
This work is licensed under a Creative Commons Attribution-NonCommercial 4.0 International License.
This is an Open Access article distributed under the terms of the Attribution-Noncommercial 4.0 International License [CC BY-NC 4.0], which requires that reusers give credit to the creator. It allows reusers to distribute, remix, adapt, and build upon the material in any medium or format, for noncommercial purposes only.How to Cite
[1]
“On Optimization of Manufacturing of Field-effect Transistors to Increase Their Integration Rate in the Framework of a Double-tail Dynamic Comparator”, ajcse, vol. 6, no. 4, Dec. 2021, doi: 10.22377/ajcse.v6i4.170.